Week 1 : Introduction: Importance, Challenges, Levels of abstraction, Fault Models, Advanced issues
Week 2 : Design for Testability: Introduction, Testability Analysis, DFT Basics, Scan cell design, Scan Architecture
Week 3 : Design for Testability: Scan design rules, Scan design flow . Fault Simulation: Introduction, Simulation models
Week 4 : Fault Simulation: Logic simulation, Fault simulation
Week 5 : Test Generation: Introduction, Exhaustive testing, Boolean difference, Basic ATPG algorithms
Week 6 : Test Generation: ATPG for non stuck-at faults, Other issues in test generation Built-In-Self-Test: Introduction, BIST design rules
Week 7 : Built-In-Self-Test: Test pattern generation, Output response analysis, Logic BIST architectures
Week 8 : Test Compression: Introduction, Stimulus compression
Week 9 : Test Compression: Stimulus compression, Response compression
Week 10 : Memory Testing: Introduction, RAM fault models, RAM test generation
Week 11 : Memory Testing: Memory BIST Power and Thermal Aware Test: Importance, Power models, Low power ATPG
Week 12 : Power and Thermal Aware Test: Low power BIST, Thermal aware techniques
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